AFM, Bruker Dimension Icon
We are pleased to announce that we have just acquired a new state-of-the-art Dimension ICON-PT atomic force microscope (AFM). Three major new capabilities of this system relative to the old system are a closed-loop scanner, ScanAsyst, and PeakForce QNM. These new capabilities increase the precision for our measurements, decrease user intervention necessary to set gains, and allow routine and high-resolution mapping of the mechanical properties of films, respectively. This system replaces our Dimension 3000, and continues to offer contact and tapping modes.
Training available by request. Please contact Dr. Brian Van Devener if you are interested in signing up for a training session.
Instrument Capabilities
Range
- X-Y scan range:90 90 μm2
- Max Z range:10 μm
- Vertical Resolution:
- Vertical Noise Floor:< 30 pm RMS
- New-design XYZ closed-loop head delivers higher scan speed, without loss of image quality, enabling greater throughput for data collection.
Software
- Nanoscope v8.1 Controller Software
- ImageView 1.2 Offline Analysis Software (available to University users)
PeakForceTM Tapping Mode
Based on Veeco's exclusive Peak Force TappingTM technology, this mode records very fast forceresponse curves at everysingle pixel in the image. Thus, the forces applied to the sample areprecisely controlled and a variety of probes can be used. It also allows measurment of material properties over an extremely wide range: ~1 MPa to 50 GPa for modulus and 10 pN to 10 N for adhesion, encompassing many sample types. These capabilities dramatically exceed those of any other technique for nanoscale materials characterization.
Last Updated: July 27,2011