The Quanta dbFIB combines a high resolution scanning electron microscope (SEM) with a focused ion beam (FIB) together in one instrument; allowing users to mill/cross section their samples and image the results.

The deposition processes result in patterned films of non-crystalline platinum.Deposition/milling of various shapes includes: lines, boxes, polygons etc.BMP files can be directly imported for 3D milling. We do not yet have the Omniprobe option, which allows lift out of samples prepared for TEM analysis, though the cuts can be made.

For SEM anlaysis, samples can be imaged under high vacuum, low vacuum and ESEM conditions. Furthermore, theelectron beam can be used to compensate for charging when milling non-conductive samples.

Future Capabilities